Hydrochloric acid 37,0 - 38,0%, CMOS for microelectronic, J.T.Baker®
Supplier: Avantor
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Danger
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Synonyms:
Hydrochloric acid solution, Muriatic acid
Management of Change (MOC) category = R
BAKR9529-07EA
590
SGD
BAKR9529-07
BAKR9529-15
Hydrochloric acid 37,0 - 38,0%, CMOS for microelectronic, J.T.Baker®
Hydrochloric acid
Formula:
HCl MW: 36,46 g/mol Boiling Pt: 110 °C (1013 hPa) Melting Pt: –30 °C Density: 1,18 g/cm³ (20 °C) Storage Temperature: Ambient |
MDL Number:
MFCD00011324 CAS Number: 7647-01-0 EINECS: 231-595-7 UN: 1789 ADR: 8,II |
Specification Test Results
For Microelectronic Use | 37.0 - 38.0 % |
Store below 25°C |
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Assay (as HCl) (by acid-base titrn) | 37.0 - 38.0 % |
Color (APHA) | ≤ 10 |
Residue after Ignition | ≤ 3 ppm |
Extractable Organic Substances | ≤ 3 ppm |
Bromide (Br) | ≤ 0.005 % |
Free Halogen (as Cl₂) | Passes Test |
Ammonium (NH₄) | ≤ 1 ppm |
Phosphate (PO₄) | ≤ 0.05 ppm |
Sulfate (SO₄) | ≤ 0.3 ppm |
Sulfite (SO₃) | ≤ 0.8 ppm |
Trace Impurities - Aluminum (Al) | ≤ 50.0 ppb |
Arsenic and Antimony (as As) | ≤ 5.0 ppb |
Trace Impurities - Barium (Ba) | ≤ 20.0 ppb |
Trace Impurities - Beryllium (Be) | ≤ 10.0 ppb |
Trace Impurities - Bismuth (Bi) | ≤ 20.0 ppb |
Trace Impurities - Boron (B) | ≤ 20.0 ppb |
Trace Impurities - Cadmium (Cd) | ≤ 5.0 ppb |
Trace Impurities - Calcium (Ca) | ≤ 100.0 ppb |
Trace Impurities - Chromium (Cr) | ≤ 10.0 ppb |
Trace Impurities - Cobalt (Co) | ≤ 5.0 ppb |
Trace Impurities - Copper (Cu) | ≤ 5.0 ppb |
Trace Impurities - Gallium (Ga) | ≤ 20.0 ppb |
Trace Impurities - Germanium (Ge) | ≤ 20 ppb |
Trace Impurities - Gold (Au) | ≤ 20 ppb |
Heavy Metals (as Pb) | ≤ 100 ppb |
Trace Impurities - Iron (Fe) | ≤ 50.0 ppb |
Trace Impurities - Lead (Pb) | ≤ 20.0 ppb |
Trace Impurities - Lithium (Li) | ≤ 20.0 ppb |
Trace Impurities - Magnesium (Mg) | ≤ 50.0 ppb |
Trace Impurities - Manganese (Mn) | ≤ 5.0 ppb |
Trace Impurities - Molybdenum (Mo) | ≤ 10.0 ppb |
Trace Impurities - Nickel (Ni) | ≤ 10.0 ppb |
Trace Impurities - Niobium (Nb) | ≤ 10.0 ppb |
Trace Impurities - Potassium (K) | ≤ 50 ppb |
Trace Impurities - Silicon (Si) | ≤ 100.0 ppb |
Trace Impurities - Silver (Ag) | ≤ 20.0 ppb |
Trace Impurities - Sodium (Na) | ≤ 100.0 ppb |
Trace Impurities - Strontium (Sr) | ≤ 20.0 ppb |
Trace Impurities - Tantalum (Ta) | ≤ 10.0 ppb |
Trace Impurities - Thallium (Tl) | ≤ 20.0 ppb |
Trace Impurities - Tin (Sn) | ≤ 50 ppb |
Trace Impurities - Titanium (Ti) | ≤ 10.0 ppb |
Trace Impurities - Vanadium (V) | ≤ 10.0 ppb |
Trace Impurities - Zinc (Zn) | ≤ 30.0 ppb |
Trace Impurities - Zirconium (Zr) | ≤ 10.0 ppb |
Particle Count at point of fill - 0.5 µm and greater | ≤ 150 par/ml |
Particle Count at point of fill - 1.0 µm and greater | ≤ 25 par/ml |
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